July 6, 2026

2-3 September 2026

We look forward to welcoming you to the 2026 UKNIBC User Day at the University of Surrey which is home to 4 Ion implanters, 2 Single Ion Implanters, 2 Focused Ion Beams and a bespoke Ion Beam Analysis facility.

The focus will be on presentations by our wide-ranging user community but we also warmly welcome those whose projects are ongoing and prospective users who are looking to explore the possibilities. This will be an excellent opportunity to share your research and to discover the potential offered by the UKNIBC with fellow users and the operators of the facilities within the centre.

Celebrate the grand opening of our new Multimodal Ion Beam Imaging Facility!

Registration is free. Please let us know if you would like to present a poster when registering. 

Posters should be A0 Portrait to fit the boards.

Please direct any enquiries related to the event to n.clifton@surrey.ac.uk

The meeting will take place in the Lecture Theatre Block (building 23) on the Stag Hill Campus on the map that can be found here.

Registration deadline: EOD 20 August 2026

Programme

Day 1 — Wednesday, 2 September

Time

Session

 

10:30 – 12:30

Steering Committee Meeting

 

12:30 – 13:15

Lunch Break & Poster Session

 

 

Welcome & Session 1

Chair: Satheesh Krishnamurthy

13:15 – 13:30

UKNIBC Facilities Updates

Satheesh Krishnamurthy – University of Surrey

Jonathan Hinks – UKAEA

Fred Currell – University of Manchester

13:30 – 13:55

Cornerstone

Graham Reed – CORNERSTONE, University of Southampton

13:55 – 14:20

The challenges of ion implantation in silicon carbide

Peter Ward – University of Warwick

14:20 – 14:45

Power technologies with (ultra)wide band gap semiconductors

Martin Kuball – University of Bristol

14:45 – 15:10

Quantum Diamond: Doping during growth process and via implantation

M.S. Ramachandra Rao – Indian Institute of Technology (IIT) Madras (online)

15:10 – 15:30

Coffee Break & Posters

 

 

Session 2

Chair: Fred Currell/Andy Smith

15:30 – 15:55

Tuning and Activation of Dopants in Cubic Silicon Carbide 3C-SiC on Silicon Substrates

Vishal Shah – University of Warwick

15:55 – 16:20

Ion beams in aid of materials testing for nuclear structures

Enrique Jimenez – University of Birmingham

16:20 – 16:45

Hydrogen in dielectrics grown by atomic layer deposition for silicon surface passivation

Sophie Pain – University of Birmingham

16:45 – 17:10

Irradiation induced ordering and precipitation observed in a novel FeCrNiSi alloy

Luke Howard – University of Birmingham

17:10 – 17:35

Development of In-Situ Proton Irradiation Creep Testing Capability

Laurence Skidmore – University of Manchester

Day 2 — Thursday, 3 September

Time

Session

Notes

9:00 – 9:30

Coffee & Registration

 

 

Session 1

Chair: Roger Webb

9:30 – 10:00

Inside the Multimodal Ion Beam Imaging Facility

Melanie Bailey – King’s College London

Catia Costa – University of Surrey

10:00 – 10:15

Cluster SIMS – an overview of analytical capabilities

Nick Lockyer – University of Manchester

10:15 – 10:30

MeV SIMS – new accelerator-based technique for analysis of organic samples

Iva Bogdanovic – Ruđer Bošković Institute

10:30 – 10:45

Integrated Chemical Imaging in Cells and Tissues

Matija Lagator – The Rosalind Franklin Institute

10:45 – 11:00

Adventures in bio-analysis on the J105

John Fletcher – University of Gothenburg

11:00 – 12:00

IBC Tours & Official opening ceremony

At Nodus Centre

12:00- 13:30

Lunch Break + Poster Session

Posters on display; IBC Tour drop-in available

 

Session 2

Chair: Ella Schneider / Catia Costa

13:30 – 13:50

Synthetic Diamond and drivers for ion implantation 

Daniel Twitchen – Element 6

13:50 – 14:10

Nanoscale Photography of Implanted Ions via Near-field Microscopy

Xinyun Liu – University of Manchester (online)

14:10 – 14:30

Coherent control of NV centers and P1 bath in FIB implanted samples

Annarita Ricci – Fraunhofer IAF (online)

14:30 – 14:50

Role of doping in contact controlled TFT performance and design for manufacture

Radu Sporea – University of Surrey

14:50 – 15:10

Electron microscopy towards detection of crystal damage resulting from single-ion implantation

Aurys Silinga – DTU Nanolab (online)

15:10 – 15:20

Sponsor Talk

Syed Jafri – A-Gas

15:20 – 15:40

Coffee Break

 

 

Session 3

Chair: Matthew Sharpe / Josh Bird

15:40 – 16:05

Next-Generation 4H-SiC Power Devices Enabled by Gate-Oxide Elemental Analysis and Deep Ion Implantation Superjunctions

Kyrylo Melnyk – University of Warwick

16:05 – 16:30

ToF-ERDA-Guided Composition-Property Relationships in Amorphous Lithium-Iron-Phosphate Thin Films

Shunli He – University College London

16:30 – 16:55

Time-of-Flight Elastic Recoil Detection Analysis for Hydrogen Characterisation at Electrochemical Random-Access Memory and Solar-Cell Nanolayer Interfaces

Sarawut (Boom) Siracosit – University of Oxford

16:55 – 17:20

Development and application of a MALDI-PIXE multimodal workflow

– Hugo Delattre

Hugo Delattre – University of Surrey & National Physical Laboratory

17:20 – 17:25

Closing Remarks

 

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